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DiffractMOD

DiffractMOD´Â DOEs(diffractive optical elements), ÆÄÀåÀÌÇÏ ÁֱⱸÁ¶, ±×¸®°í ±¤ ¹êµå°¸ °áÁ¤°ú °°Àº ȸÀý±¤ÇÐ ±¸Á¶¸¦ ¼³°èÇÏ°í ½Ã¹Ä·¹À̼ÇÇÏ´Â ÅøÀÔ´Ï´Ù. fast Fourier factorization¿Í ÀϹÝÈ­µÈ transmission line formulationÀ» Æ÷ÇÔÇÏ´Â °í±Þ ¾Ë°í¸®Áò RCWA(Rigorous Coupled Wave Analysis) ±â¼úÀ» ±â¹ÝÀ¸·Î ÇÕ´Ï´Ù. ÀÌ ÅøÀº ¹ÝµµÃ¼ Á¦Á¶¿Í Æĵ¿±¤ÇÐÀ» Æ÷ÇÔÇÏ´Â ±¤¹üÀ§ÇÑ ºÐ¾ß¿¡ Àû¿ë µÉ ¼ö ÀÖ½À´Ï´Ù.

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- Waveguide resonance gratings
- Diffractive Optical Elements (DOEs)
- Surface relief and volume index gratings
- Wavelength filters
- Optical metrology
- Nano-lithography
- Polarization sensitive devices
- Artificial dielectric coatings
- Photovoltaic systems
- 3D displays
- Optical interconnections
- Optical data storage
- Spectroscopy
Ư¡
- fast Fourier factorization¿Í ÀϹÝÈ­µÈ transmission line formulationÀ» Æ÷ÇÔÇÏ´Â
°í±Þ ¾Ë°í¸®ÁòÀÎ RCAW (Rigorous Coupled Wave Analysis) ±â¼ú ±â¹Ý
- ¹ÝµµÃ¼ Á¦Á¶¿Í Æĵ¿±¤ÇÐÀ» Æ÷ÇÔÇÏ´Â ³ÐÀº ¹üÀ§ÀÇ ¾îÇø®ÄÉÀ̼ǿ¡¼­ È°¿ë
- ¼º´ÉÇâ»óÀ» À§Çؼ­ ±âº»ÀûÀÎ RCWA¸¦ È®ÀåÇÑ Áøº¸µÈ ¾Ë°í¸®Áò
- ȸÀý¿¡ ´ëÇÑ ´Ù¾çÇÑ ±×·¡ÇÈ, ȸÀý È¿°ú ½ºÆåÆ®·³ Ãâ·Â ¹× °è»ê
- ´Ù¾çÇÑ È¸Àý È¿°ú °è»ê(Spectrums vs, wavelength, angle, polarization)
- ¾î¶² À§Ä¡¿¡¼­µçÁö ÇʵåÀÇ ÇÁ·ÎÆÄÀÏÀ» °è»êÇÏ°í º¸¿©ÁÖ´Â Á¤±³ÇÑ Çʵå Ãâ·Â ¿É¼Ç
- ÀϹÝÀûÀÎ °èÃø ÆĶó¹ÌÅÍ(common metrology parameters)¸¦ Á÷Á¢ Ãâ·Â
µµÀÔ°í°´
±â¾÷ ´ëÇб³ ¹× ±³À°±â°ü ¿¬±¸¼Ò ¹× ±âŸ
- Cannon
- Panasonic
- Sony
- Sumitomo
- Ricoh
- Toshiba
- Hitachi
- Nikon
- Sharp
- Fujitsu
- NEC
- Samsung
- NTT
- Philips
- Mitsubishi
- LG
- Princeton University
- California Institute of Technology
- Cornell University
- University of California
- McMaster University
- Tokyo Institute of Technology
- The University of Tokyo
- Kyoto University
- Ajou University
- Tsinghua University
- Osaka University
- University of Twente
- Universitat Heidelberg
- Gwangju Institute of Science
and Technology
- Israel Institute of Technology
- Air Force Research Laboratory
- Sandia National Laboratories
- AIST
- NICT
- DSO
- KAIST